Frequency Domain Thickness Measurement Approach for Microscale Multilayered Structures

Spatial Domain Green’s Functions for Planar Multilayered Structures

This paper presents a robust approach for calculating spatial-domain Green’s functions on the interface or close to the interface of planar multilayered microstrip structures with lossless or lossy dielectric materials for a wide range of frequencies and layer thicknesses. We compute the mixed potential Green’s functions for distance for 200 points from 0.1 to 10 wavelengths. The CPU is less th...

Microscale Thermal Characterization by Inverse Method in the Frequency Domain

In this communication, several aspects of the implementation of a finite element method for the resolution of inverse problems (occurring in parameter identification) are exposed. Identification of a thermal parameter (diffusivity) at micrometric scale is obtained from observations of output signal due to a periodic input. Resolution of this identification problem is facilitated by the formulat...

Discriminant Analysis for ARMA Models Based on Divergency Criterion: A Frequency Domain Approach

The extension of classical analysis to time series data is the basic problem faced in many fields, such as engineering, economic and medicine. The main objective of discriminant time series analysis is to examine how far it is possible to distinguish between various groups. There are two situations to be considered in the linear time series models. Firstly when the main discriminatory informati...

A Novel Intelligent Fault Diagnosis Approach for Critical Rotating Machinery in the Time-frequency Domain

The rotating machinery is a common class of machinery in the industry. The root cause of faults in the rotating machinery is often faulty rolling element bearings. This paper presents a novel technique using artificial neural network learning for automated diagnosis of localized faults in rolling element bearings. The inputs of this technique are a number of features (harmmean and median), whic...

Multilayered Amorphous Silicon Structures